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> Estek wis 600A wafer inspection system 3 - 6 inch wafer
Estek wis 600A wafer inspection system 3 - 6 inch wafer
Includes: Computer Monitor & Stand Model: WIS 600A
Designed to completely analyze substrates, films and oxides used in the manufacture of semiconductors. Dark and light channel system. Dark channel is used for detecting particles and any light scattering defects. Light channel is useful for detecting non-light scattering defects such as mounds, dimples and non uniformity. Detects specular flaws, including large particles, mounds, dimples, saw marks, grooves, fractures, slip, epi-spikes, small particles on large grained surfaces, particles buried in/under a film. Detection 0.30 um or .20 um(optional) on Silicon at 95% capture rate. Verified by NIST Traceable Standards.
Manufacturers Representative Specializing in New/Remanufactured Semiconductor Equipment.
NOTE: The photo of this unit is not good. We are working on a better one.
Pick-up location: Northern, CA (Located at our Northern, CA warehouse)
