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> Keithley 595 quasistatic c-v meter tested 7 day inspect
Keithley 595 quasistatic c-v meter tested 7 day inspect
The Keithley Model 595 Quasistatic C-V Meter measures quasistatic capacitance versus voltage (C-V)
characteristics of Metal Insulator Semiconductor (MIS) semiconductor devices. The C-V measurement
technique used by the Model 595 provides diagnostics and correction for common sources of errors to
increase confidence in test results.
Its current function serves as a sensitive picoammeter, directly measuring DC currents to 1fA. The built-in
+/- 20V voltage source with DC, stair-case, and squarewave waveforms permits both current and quasistatic
capacitance measurements to be made either at a single device bias or as a function of voltage. This
measurement flexibility makes the Model 595 appropriate for characterization of many semiconductor
Use of this technique makes it easy to measure quasistatic C-V characteristics of devices that would be
unsuitable for testing with the traditional ramp method and static or Q-V methods.
Built-in Voltage Source - +/- 20V @ 2mA voltaghe source with 10mV resolution
Bias Waveforms DC, square wave, and staircase voltage bias waveforms allow the user to make
stepped current or capacitance measurements, as well as DC current measurements
Voltage Steps In +/-10mV, 20mV, 50mV, and 100mV gradations at 0.07 to 199.99sec intervals in 0.01sec
Q/t Measurement Q/t monitors current during capacitance menasurement.
Compensates for Error Currents Selectable capacitance correction for leakage current errors.
4 Digit Display An easy-to-read fornt panel LED display includes a 4 digit mantissa with selectable
alphanumeric or scientific range annumciation.
Rapid assurance of device equilibrium
Superior signal-to-noise performance, even with the slow voltage sweeps required by today's
